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SPEA H3560 P&P Handler w/ C600MXIC Multi‑Mode Semiconductor Tester USED 0
SPEA H3560 P&P Handler w/ C600MXIC Multi‑Mode Semiconductor Tester USED 1
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SPEA H3560 P&P Handler w/ C600MXIC Multi‑Mode Semiconductor Tester USED

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Availability:

1 in stock
BRAND: SPEA MODEL: H3560 W/ C600MXIC CONDITION: used
SKU: IGAM2700062 Weight: 4004 lbs Freight (Item Must Ship Freight)

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Overview

This listing is for a USED SPEA H3560 Multimode Semiconductor Test System paired with a SPEA C600MXIC Tester Module. This integrated solution is designed for automated semiconductor device testing and includes a built‑in pick‑and‑place handler, control electronics, tester cabinet, and PC-based system interface. The H3560 Handler is rated at 230V, 5.8kVA, 50/60Hz with 0.7MPa air pressure requirement, and the C600MXIC Tester Module is rated at 208V 3‑phase, 15kVA, 50/60Hz. Both units were manufactured in 2011 and include cabling, system documentation, and software as pictured. Unit is untested and sold as‑is.

Specification Table

Manufacturer: SPEA SpA (Italy) Handler Model: H3560 Handler Serial No: VSL086AA Handler Voltage: 230V Handler Frequency: 50/60 Hz Handler Power: 5.8 kVA Air Pressure Requirement: 0.7 MPa Handler Weight: 2200 kg Handler YOM: 2011 Tester Module Model: C600MXIC Tester Module Serial No: RKL055AA Tester Module Voltage: 208V (3PH) Tester Module Frequency: 50/60 Hz Tester Module Power: 15 kVA Tester Module Weight: 450 kg Tester Module Year: 2011 Included Components: Integrated P&P Handler, Control Cabinet, Cables Condition: USED (Untested, Sold As-Is)
▸ Key Features:
• Integrated semiconductor handler with pick-and-place (P&P) capabilities
• Multimode semiconductor tester suitable for analog, mixed-signal, and digital ICs
• Large front-access test chamber with safety interlocked viewing windows
• SPEA C600MXIC tester module provides high-channel-count device testing
• Industrial control cabinet with dedicated system power controller (SPEA MPC400)
• Includes system documentation, operating system software, and interface media
• Heavy‑duty equipment designed for high‑volume production and engineering test environments
• All major system specifications visible on attached nameplates (see photos)
▸ Applications:
• Automated IC testing in production environments
• Engineering characterization and qualification of semiconductor devices
• Mixed‑signal, analog, and power IC validation
• Pick‑and‑place device handling for high‑accuracy measurements
• High‑volume semiconductor device throughput operations
• Integration into SPEA automated test lines for device evaluation
▸ Alternative Model Numbers:
H3560-IC
C600MX Series Test Modules
SPEA 6000MX Family
SPEA Mixed-Signal Test Platforms
SPEA Automated Device Handlers
▸ Common Misspellings or Phrasing:
H356O (letter O)
SPEA H-3560
C600 MXIC
C600-MXIC
SPEA Semiconductor Handler System

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