▸ Key Features:
• Integrated semiconductor handler with pick-and-place (P&P) capabilities
• Multimode semiconductor tester suitable for analog, mixed-signal, and digital ICs
• Large front-access test chamber with safety interlocked viewing windows
• SPEA C600MXIC tester module provides high-channel-count device testing
• Industrial control cabinet with dedicated system power controller (SPEA MPC400)
• Includes system documentation, operating system software, and interface media
• Heavy‑duty equipment designed for high‑volume production and engineering test environments
• All major system specifications visible on attached nameplates (see photos)
▸ Applications:
• Automated IC testing in production environments
• Engineering characterization and qualification of semiconductor devices
• Mixed‑signal, analog, and power IC validation
• Pick‑and‑place device handling for high‑accuracy measurements
• High‑volume semiconductor device throughput operations
• Integration into SPEA automated test lines for device evaluation
▸ Alternative Model Numbers:
H3560-IC
C600MX Series Test Modules
SPEA 6000MX Family
SPEA Mixed-Signal Test Platforms
SPEA Automated Device Handlers
▸ Common Misspellings or Phrasing:
H356O (letter O)
SPEA H-3560
C600 MXIC
C600-MXIC
SPEA Semiconductor Handler System
